HB-LED 标准技术委员会

委员会章程与范围:

Charter of Global HB-LED Committee

To explore, evaluate, discuss, and create consensus-based specifications, guidelines, and practices that, through voluntary compliance, will;
promote mutual understanding and improved communication between users and suppliers of HB-LED (high-brightness light-emitting diode) materials, carriers, automation systems and devices, and enhance the manufacturing efficiency and capability and shorten time-to-market so as to reduce manufacturing cost in the HB-LED industry. to include liaisons and synergies with other SEMI technical committees for the development of HB-LED related standards.
Scope The HB-LED standards committee scope will include but not be limited to exploring and developing standards that pertain to common criteria, guidelines, methods for control and comparison of HB-LED related process / metrology equipment, materials, components, or manufacturing operations in whole LED supply chain.
It will also seek to support the international need for increasing LED product / process yield and reducing related LED costs.
In addition to the above, the committee will also facilitate any industry initiatives towards product standardization needs.

工作组与在研标准项目 / Task Force and SNARFs

外延晶片工作组 / GaN based LED Epitaxial Wafer Task Force
  TASK FORCE ORGANIZATION FORM (TFOF)
HB-LED通讯接口工作组 / HB-LED Equipment Communication Interface Task Force
  TASK FORCE ORGANIZATION FORM (TFOF)
  6370 New Standard: Specification of Susceptors for HB-LED MOCVD Equipment Communication Interface
  6503 New Standard: Specification of Recipe Management for LED Equipment
  6589 Revision to SEMI HB4-0913 (Reapproved 0419), Specification of Communication Interfaces for High Brightness LED Manufacturing Equipment (HB-LED ECI)
图形化蓝宝石衬底工作组 / Patterned Sapphire Substrate Task Force
  TASK FORCE ORGANIZATION FORM (TFOF)
  6192 New Standard: Specification for Dry-Etched Patterned Sapphire Substrates (DPSS)
  6371 New Standard: Test Method for Determining Geometrical Parameters of Patterns on Patterned Sapphire Substrate
蓝宝石晶棒工作组 / Sapphire Single Crystal Ingot Task Force
  TASK FORCE ORGANIZATION FORM (TFOF)
  5775 New Standard: Specification for Sapphire Single Crystal Ingot Intended for Use for Manufacturing HB-LED Wafers
  6502 Line Item Revision to SEMI HB11-0819, Specification for Sapphire Single Crystal Ingot Intended for Use for Manufacturing HB-LED Wafers
蓝宝石单晶定向工作组 / Sapphire Single Crystal Orientation Task Force (inactive)
  TASK FORCE ORGANIZATION FORM (TFOF)
单晶蓝宝石工作组 / Single Crystal Sapphire Task Force
  TASK FORCE ORGANIZATION FORM (TFOF)
  5629 New Standard, Guide for Identification Defects on Bare Surfaces of Sapphire Wafers
  5946 New Standard: Test Method for Grain Boundary of Single Crystal Sapphire by Optical Homogeneity Technique (OHT)
 

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