柔性电子标准
SEMI标准
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这是可能的相关标准的资源，而非详尽列表。请访问 https://store-us.semi.org/collections/standards 获取完整的标准列表。
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3D-IC（3D）
- 3D2-用于3DS-IC应用的玻璃载体晶片规范
- 3D3-胶带框架上300毫米薄硅晶圆的多晶圆运输和存储容器指南
- 3D12-低硬度晶片的平面度和形状测量指南
- 3D19-用于薄切屑处理的托盘的粘合强度的测试方法
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平板显示器（D）
- D8-描述在3DS-IC临时键合剥离（TBDB）工艺中用作300 mm载片的硅片的指南
- D78-电子设备用高阻隔性塑料薄膜的水蒸气阻隔性测试方法
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设备自动化硬件（E）
- E6 - Guide for Semiconductor Equipment Installation Documentation
- E12 - Guide for Standardized Pressure, Temperature, Density, and Flow Units Used in Mass Flow Meters and Mass Flow Controllers
- E16 - Guide for Determining and Describing Mass Flow Controller Leak Rates
- E17 - Guide for Mass Flow Controller Transient Characteristics Tests
- E18 - Guide for Temperature Specifications of the Mass Flow Controller
- E27 - Guide for Mass Flow Controller and Mass Flow Meter Linearity
- E28 - Guide for Pressure Specifications of the Mass Flow Controller
- E35 - Guide to Calculate Cost of Ownership (COO) Metrics for Semiconductor Manufacturing Equipment
- E43 - Guide for Electrostatic Measurements on Objects and Surfaces
- E45 - Test Method for the Determination of Inorganic Contamination from Minienvironments Using VPD-TXRF, VPD-AAS, or VPD/ICP-MS
- E46 - Test Method for the Determination of Organic Contamination from Minienvironments Using Ion Mobility Spectrometry (IMS)
- E49 - Guide for High Purity and Ultrahigh Purity Piping Performance, Subassemblies, and Final Assemblies
- E51 - Guide for Typical Facilities Services and Termination Matrix
- E66 - Test Method for Determining Particle Contribution by Mass Flow Controllers
- E67 - Test Method for Determining Reliability of Mass Flow Controller
- E68 - Test Method for Determining Warm-Up Time of Mass Flow Controllers
- E69 - Test Method for Determining Reproducibility and Zero Drift for Thermal Mass Flow Controllers
- E72 - Specification and Guide for Equipment Footprint, Height, and Weight
- E78 - Guide to Assess and Control Electrostatic Discharge (ESD) and Electrostatic Attraction (ESA) for Equipment
- E79 - Specification for Definition and Measurement of Equipment Productivity
- E108 - Test Method for the Assessment of Outgassing Organic Contamination from Minienvironments Using Gas Chromatography/Mass Spectroscopy
- E116 - Specification for Equipment Performance Tracking
- E124 - Guide for Definition and Calculation of Overall Factory Efficiency (OFE) and Other Associated Factory-Level Productivity Metrics
- E137 - Guide for Final Assembly, Packaging, Transportation, Unpacking, and Relocation of Semiconductor Manufacturing Equipment
- E140 - Guide to Calculate Cost of Ownership (COO) Metrics for Gas Delivery Systems
- E141 - Guide for Specification of Ellipsometer Equipment for Use in Integrated Metrology
- E149 - Guide for Equipment Supplier-Provided Documentation for the Acquisition and Use of Manufacturing Equipment
- E150 - Guide for Equipment Training Best Practices
- E165 - Guide for a Comprehensive Equipment Training System When Dedicated Training Equipment is not Available
- E176 - Guide to Assess and Minimize Electromagnetic Interference (EMI) in a Semiconductor Manufacturing Environment
- Equipment Automation Software (E) - Entire Volume
- Facilities (F) - Entire Volume
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Materials (M)
- M56 - Practice for Determining Cost Components for Metrology Equipment Due to Measurement Variability and Bias
- M59 - Terminology for Silicon Technology
- MEMS (MS) - Entire Volume
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Packaging (G)
- G66 - Test Method for the Measurement of Water Absorption Characteristics for Semiconductor Plastic Molding Compounds
- G73 - Test Method for Pull Strength for Wire Bonding
- G79 - Specification for Overall Digital Timing Accuracy
- G96 - Test Method for Measurement of Chip (Die) Strength by Mean of Cantilever Bending
- G71 - Specification for Barcode Marking of Intermediate Containers for Packaging Materials
- G83 - Specification for Bar Code Marking of Product Packages
- G86 - Test Method for Measurement of Chip (Die) Strength by Mean of 3-Point Bending
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Photovoltaic (PV)
- PV56 - Test Method for Performance Criteria of Photovoltaic (PV) Cells and Modules Package
- PV57 - Test Method for Current-Voltage (I-V) Performance Measurement of Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC)
- PV77 - Guide for Calibration of Photovoltaic (PV) Module UV Test Chambers
- PV78 - Test Method for Bending Property of Flexible Thin Film Photovoltaic (PV) Modules
- PV80 - Specification of Indoor Lighting Simulator Requirements for Emerging Photovoltaic
- PV87 - Test Method for Peeling Force Between Electrode and Ribbon/Back Sheet
- Process Chemicals (C) - Entire Volume
- Safety Guidelines (S) - Entire Volume
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Traceability (T)
- T12 - Specification for Tracing Jigs and Implements
- T13 - Specification for Device Tracking: Concepts, Behavior, and Services
- T18 - Specification of Parts and Components Traceability
- T19 - Specification for Device Marking
- T21 - Specification for Organization Identification by Digital Certificate Issued from Certificate Service Body (CSB) for Anti-Counterfeiting Traceability in Components Supply Chain
IPC Standards
This is a resource, not an exhaustive list, of possible relevant standards. Please visit http://shop.ipc.org/standards for a full list of standards
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IPC/JPCA-2291, Design Guideline for Printed Electronics (2013)
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IPC/JPCA-4591, Requirements for Printed Electronics Functional Conductive Materials
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IPC/JPCA-4921, Requirements for Printed Electronics Base Materials (Substrates)
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IPC/JPCA-6901, Application Categories for Printed Electronics
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IPC-6903, Terms and Definitions for the Design and Manufacture of Printed Electronics (Additive Circuitry) (2016)
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IPC-2292, Design Standard for Printed Electronics on Flexible Substrates
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IPC-9204, Guideline on Flexibility & Stretchability Testing for PE
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IPC-9691B (IPC-TM-650), User Guide for the IPC-TM-650, Method 2.4.3 – Sliding parallel plate test
IEC Standards
This is a resource, not an exhaustive list, of possible relevant standards. Please visit https://webstore.iec.ch/home for a full list of standards
- IEC 62899-101 Terminology - Vocabulary
- IEC 62899-201 Materials - Substrates
- IEC 62899-202 Materials - Conductive ink - sheet resistance
- IEC 62899-203 Materials - Semiconductor ink
- IEC 62899-204 Materials - Insulator Ink
- IEC 62899-250 Material technologies required in printed electronics for wearable smart devices
- IEC 62899-302 Equipment - Inkjet - Imaging
- IEC 62899-303 Equipment - Roll-to-roll printing - Mechanical dimensions
- IEC 62899-401 Printability - Overview
- IEC 62899-402 Printability - Measurement of qualities - Pattern width
- IEC 62899-403 Printability - Requirements for reproducibility - Basic patterns for evaluation of printing machine
- IEC 62899-501 Quality assessment - Failure modes and mechanical testing
- IEC 62899-502 Quality assessment - Organic light emitting diode (OLED) elements
ISO Standards
This is a resource, not an exhaustive list, of possible relevant standards. Please visit https://www.iso.org/store.html for a full list of standards
- ISO 4287, Dimensional and geometrical product specifications and verification
- ISO 489, Plastics - Determination of refractive index
- ISO 15106, Plastics - Film and sheeting - Determination of water vapor transmission rate
- ISO 16525, Adhesives - Test Methods for Isotropic Electrically Conductive Adhesives
ASTM Standards
This is a resource, not an exhaustive list, of possible relevant standards. Please visit https://www.astm.org/ for a full list of standards
- C623 - Standard Test Method for Young's Modulus, Shear Modulus, and Poisson's Ratio for Glass and Glass-Ceramics by Resonance
- D149 - Standard Test Method for Dielectric Breakdown Voltage and Dielectric Strength of Solid Electrical Insulating Materials at Commercial Power Frequencies
- D1505 - Standard Test Method for Density of Plastics by the Density-Gradient Technique
- D2520 - Standard Test Methods for Complex Permittivity (Dielectric Constant) of Solid Electrical Insulating Materials at Microwave Frequencies and Temperatures to 1650oC
- D257 - Standard Test Methods for DC Resistance or Conductance of Insulating Materials
- D2861 - Test Methods for Flexible Composites of Copper Foil with Dielectric Film or Treated Fabrics
- D522 - Test Methods for Mandrel Bend Test of Attached Organic Coatings
- D542 - Standard Test Method for Index of Refraction of Transparent Organic Plastics
- D5470 - Standard Test Method for Thermal Transmission Properties of Thermally Conductive Electrical Insulation Materials
- D6343 - Standard Test Methods for Thin Thermally Conductive Solid Materials for Electrical Insulation and Dielectric Applications
- D696 - Test Method for Coefficient of Linear Thermal Expansion of Plastics
- D7127 - Standard Test Method for Measurement of Surface Roughness of Abrasive Blast Cleaned Metal Surfaces Using a Portable Stylus Instrument
- D7490 - Standard Test Method for Measurement of the Surface Tension of Solid Coatings, Substrates and Pigments using Contact Angle Measurements
- D882 - Standard Test Method for Tensile Properties of Thin Plastic Sheeting
- E1356 - Standard Test Method for Assignment of the Glass Transition Temperatures by Differential Scanning Calorimetry
- E290 - Test Methods for Bend Testing of Material for Ductility
- E384 - Standard Test Method for Microindentation Hardness of Materials
- E96/E96M - Standard Test Methods for Water Vapor Transmission of Materials
- F1578 - Standard Test Method for Contact Closure Cycling of a Membrane Switch
- F1595 - Standard Practice for Viewing Conditions for Visual Inspection of Membrane Switches
- F1596 - Standard Test Method for Exposure of a Membrane Switch or Printed Electronic Device to Temperature and Relative Humidity
- F1598 - Standard Test Method for Determining the Effects of Chemical/Solvent Exposure to a Membrane Switch/Graphic Overlay (Spot Test Method)
- F1661 - Standard Test Method for Determining the Contact Bounce Time of a Membrane Switch
- F1662 - Standard Test Method for Verifying the Specified Dielectric Withstand Voltage and Determining the Dielectric Breakdown Voltage of a Membrane Switch or Printed Electronic Device
- F1663 - Standard Test Method for Determining the Capacitance of a Membrane Switch or Printed Electronic Device
- F1680 - Standard Test Method for Determining Circuit Resistance of a Membrane Switch
- F1681 - Standard Test Method for Determining Current Carrying Capacity of a Membrane Switch Circuit
- F1683 - Practice for Creasing or Bending a Membrane Switch, Membrane Switch Flex Tail Assembly or Membrane Switch Component
- F1689 - Standard Test Method for Determining the Insulation Resistance of a Membrane Switch
- F1762 - Standard Test Method for Determining the Effects of Atmospheric Pressure Variation on a Membrane Switch
- F1812 - Standard Test Method for Determining the Effect of an ESD Discharge on a Membrane Switch or Printed Electronic Device
- F1842 - Standard Test Method for Determining Ink or Coating Adhesion on Flexible Substrates for a Membrane Switch or Printed Electronic Device
- F1843 - Standard Practice for Sample Preparation of Plastic Films used on Membrane Switch Overlays for Specular Gloss Measurements
- F1895 - Standard Test Method for Submersion of a Membrane Switch
- F1896 - Test Method for Determining the Electrical Resistivity of a Printed Conductive Material
- F1995 - Standard Test Method for Determining the Shear Strength of the Bond between a Surface Mount Device (SMD) and Substrate in a Membrane Switch
- F1996 - Standard Test Method for Silver Migration for Membrane Switch Circuitry
- F2072 - Standard Test Method for Hosedown of a Membrane Switch
- F2073 - Standard Test Method for Non-Destructive Short Circuit Testing of a Membrane Switch
- F2112 - Standard Terminology for Membrane Switches
- F2187 - Standard Test Method for Determining the Effect of Random Frequency Vibration on a Membrane Switch or Membrane Switch Assembly
- F2188 - Standard Test Method for Determining the Effect of Variable Frequency Vibration on a Membrane Switch or Membrane Switch Assembly
- F2359 - Standard Test Method for Determining Color of a Membrane Switch Backlit with Diffuse Light Source
- F2360 - Standard Test Method for Determining Luminance of a Membrane Switch Backlit with Diffuse Light Source
- F2592 - Standard Test Method for Measuring the Force-Displacement of a Membrane Switch
- F2749 - Standard Test Method for Determining the Effects of Creasing a Membrane Switch or Printed Electronic Device
- F2750 - Standard Test Method for Determining the Effects of Bending a Membrane Switch or Printed Electronic Device
- F2771 - Standard Test Method for Determining the Luminance Curve of an Electroluminescent Lamp at Ambient Conditions
- F2865 - Standard Guide for Classifying the Degrees of Ingress of Dust and Water into a Membrane Switch
- F2866 - Standard Test Method for Flammability of a Membrane Switch in Defined Assembly
- F2964 - Standard Test Method for Determining the Uniformity of the Luminance of an Electroluminescent Lamp or Other Diffuse Lighting Device
- F3147 - Standard Test Method for Evaluating the Reliability of Surface Mounted Device (SMD) Joints on a Flexible Circuit by a Rolling Mandrel Bend
- F3152 - Standard Test Method for Determining Abrasion Resistance of Inks and Coatings on Substrates Using Dry or Wet Abrasive Medium
- F3290 - Standard Guide for Handling and Application of a Membrane Switch or Printed Electronic Device to its Final Support Structure
- F3291 - Standard Test Method for Measuring the Force-Resistance of a Membrane Force Sensor
TAPPI Standards
This is a resource, not an exhaustive list, of possible relevant standards. Please visit https://www.tappi.org/Publications-Standards/Standards-Methods/ for a full list of standards
- T 543, Bending resistance of paper (Gurley-type tester)
- T 566, Bending resistance (stiffness) of paper (Taber-type tester in 0 to 10 Taber stiffness unit configuration)
- T 494, Tensile properties of paper and paperboard (using constant rate of elongation apparatus)
- T 489, Bending resistance (stiffness) of paper and paperboard (Taber-type tester in basic configuration)
- T 538，纸和纸板的粗糙度（谢菲尔德方法）